![]() ![]() Digital Instruments, Inc., 6780 Cortona Drive, Santa Barbara, CA 93117 USA. It is comprised of the microscope itself and special command and control software. The NanoScope StandAIone Atomic Force Microscope is an option to the NanoScope II and III Scanning Probe Microscope systems and may be added at any time. Applications in- clude integrated circuit wafers, dia- mond-turned optics, magnetic and optical memory disks, precision- machined parts still in the lathe, and more. Almost any sur- face can be examined, and because the StandAIone ArM is light and small, it can easily be adapted for un- usual applications. Simply place the NanoScope StandAIone ArM on the sample surface and scan the area of interest. PRECIS NanoScope StandAIoneatomic force microscope Now, samples of any size-from a transistor on a semiconductor wafer to a turbine blade on a jet en- gine-can be examined with the pat- ented NanoScope StandAIone Atomic Force Microscope. ![]()
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